Exclusive

Publication

Byline

Location

US Patent Issued to Malvern Panalytical on May 19 for "Identifying charge sharing in X-ray diffraction" (Dutch Inventors)

ALEXANDRIA, Va., May 19 -- United States Patent no. 12,631,576, issued on May 19, was assigned to Malvern Panalytical B.V. (Almelo, Netherlands). "Identifying charge sharing in X-ray diffraction" was... Read More


US Patent Issued to PEKING UNIVERSITY SHENZHEN GRADUATE SCHOOL on May 19 for "Crystal structure database-based material analysis method and system, and application" (Chinese Inventors)

ALEXANDRIA, Va., May 19 -- United States Patent no. 12,631,577, issued on May 19, was assigned to PEKING UNIVERSITY SHENZHEN GRADUATE SCHOOL (Shenzhen, China). "Crystal structure database-based mater... Read More


US Patent Issued to JEOL on May 19 for "Analyzing method and analyzer" (Japanese Inventors)

ALEXANDRIA, Va., May 19 -- United States Patent no. 12,631,578, issued on May 19, was assigned to JEOL Ltd. (Tokyo). "Analyzing method and analyzer" was invented by Koki Kato (Tokyo), Shinya Fujita (... Read More


US Patent Issued to SCHLUMBERGER TECHNOLOGY on May 19 for "XRF and calcimetry evaluation of multiphase oilfield fluids" (American, French Inventors)

ALEXANDRIA, Va., May 19 -- United States Patent no. 12,631,579, issued on May 19, was assigned to SCHLUMBERGER TECHNOLOGY Corp. (Sugar Land, Texas). "XRF and calcimetry evaluation of multiphase oilfi... Read More


US Patent Issued to GUANGZHOU TERMBRAY ELECTRONICS TECH on May 19 for "Method for analyzing quality of thin surface layer of PCB" (Chinese Inventors)

ALEXANDRIA, Va., May 19 -- United States Patent no. 12,631,580, issued on May 19, was assigned to GUANGZHOU TERMBRAY ELECTRONICS TECH Co. LTD. (Guangzhou, China). "Method for analyzing quality of thi... Read More


US Patent Issued to JEOL on May 19 for "Spectrum analysis apparatus and database creation method" (Japanese Inventors)

ALEXANDRIA, Va., May 19 -- United States Patent no. 12,631,581, issued on May 19, was assigned to JEOL Ltd. (Tokyo). "Spectrum analysis apparatus and database creation method" was invented by Shogo K... Read More


US Patent Issued to NETZSCH-Geratebau on May 19 for "Thermal analysis system and thermal analysis method" (Japanese Inventors)

ALEXANDRIA, Va., May 19 -- United States Patent no. 12,631,582, issued on May 19, was assigned to NETZSCH-Geratebau GmbH (Selb, Germany). "Thermal analysis system and thermal analysis method" was inv... Read More


US Patent Issued to Huaneng (Tianjin) Coal Gasification Power Generation on May 19 for "IGCC fuel component analysis and calorific value measurement system" (Chinese Inventors)

ALEXANDRIA, Va., May 19 -- United States Patent no. 12,631,583, issued on May 19, was assigned to Huaneng (Tianjin) Coal Gasification Power Generation Co. Ltd. (Tianjin, China). "IGCC fuel component ... Read More


US Patent Issued to National Institute of Meteorological Sciences on May 19 for "Crop condition monitoring system and crop condition monitoring method using the same" (South Korean Inventors)

ALEXANDRIA, Va., May 19 -- United States Patent no. 12,631,584, issued on May 19, was assigned to National Institute of Meteorological Sciences (Seogwipo-si, South Korea). "Crop condition monitoring ... Read More


US Patent Issued to TDK on May 19 for "Gas sensor" (Japanese Inventors)

ALEXANDRIA, Va., May 19 -- United States Patent no. 12,631,585, issued on May 19, was assigned to TDK Corp. (Tokyo). "Gas sensor" was invented by Yoshio Kaita (Tokyo), Yasuhiro Inui (Tokyo) and Yutak... Read More